发明名称 SPECTROMETRY SYSTEM, SPECTROSCOPIC MODULE, AND POSITIONAL DEVIATION DETECTION METHOD
摘要 A spectrometry system includes an imaging apparatus that includes an imaging element which captures an image, and a spectroscopic module that includes a wavelength variable interference filter and an attachment unit which holds the wavelength variable interference filter, is provided to be attachable to and detachable from the imaging apparatus, and can dispose the wavelength variable interference filter on an optical path of incident light to the imaging element during attachment to the imaging apparatus.
申请公布号 US2015185081(A1) 申请公布日期 2015.07.02
申请号 US201414580848 申请日期 2014.12.23
申请人 Seiko Epson Corporation 发明人 SANO Akira;NAGATE Takashi;SAKURAI Kazunori;HIROKUBO Nozomu
分类号 G01J3/28;G01J3/02;G01J3/45 主分类号 G01J3/28
代理机构 代理人
主权项 1. A spectrometry system comprising: an imaging apparatus that includes an imaging element which captures an image; and a spectroscopic module that includes a spectroscopic unit and an attachment unit, the spectroscopic unit selectively emitting emitted light with a predetermined wavelength among first incident light and being able to change a wavelength of the emitted light, the attachment unit holding the spectroscopic unit, the attachment unit being attachable to and detachable from the imaging apparatus, second incident light to the imaging apparatus passing the spectroscopic unit when the spectroscopic module is attached to the imaging apparatus.
地址 Tokyo JP