发明名称 FAILURE DETECTION CIRCUIT AND FAILURE DETECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for feeding back to a control mechanism a failure occurring in a failure detection device for detecting a failure.SOLUTION: A failure detection device has the state of an input signal held in a first holding unit (Bit1), and outputs the state of a first output signal which is output by the first holding unit from a first output terminal (an output terminal 81) to the outside. In this case, the failure detection device feeds back the state reported by the first output terminal at a timing when the first output terminal reports the state of the first output signal. The failure detection device is configured so as to supply a mechanism that controls its own device with the state of the first holding unit (Bit1) and the state (Bit0) to be fed back.
申请公布号 JP2015121478(A) 申请公布日期 2015.07.02
申请号 JP20130265677 申请日期 2013.12.24
申请人 RENESAS ELECTRONICS CORP 发明人 KIUCHI ATSUSHI
分类号 G01R31/28;G06F11/22;H01L21/822;H01L27/04 主分类号 G01R31/28
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