发明名称 X-RAY ANALYZER
摘要 PROBLEM TO BE SOLVED: To shield visible light and infrared light, minimize thickness of an X-ray window, and consequently acquire an X-ray equal to or less than 1 keV efficiently.SOLUTION: An X-ray analyzer 10 includes: an electron gun 14 which discharges a characteristic X-ray 13 by exciting a sample 11 being an analysis object; a transition end sensor (TES) 15 which detects the characteristic X-ray 13; and an electromagnetic wave shield part 24 and a heat shielding part 19 sequentially arranged from the sample 11 to the TES 15. The electromagnetic wave shielding part 24 is a capillary 25 having a through hole formation part which forms a through hole through which the characteristic X-ray 13 passes. The through hole formation part forms the through hole with the size at least equal to or less than 50 μm. The heat shielding part 19 includes a first X-ray window 22 and a second X-ray window 23 for transmitting the characteristic X-ray 13, and the sizes of the first X-ray window 22 and the second X-ray window 23 are made equal to or smaller than the size of the capillary 25.
申请公布号 JP2015121479(A) 申请公布日期 2015.07.02
申请号 JP20130265681 申请日期 2013.12.24
申请人 HITACHI HIGH-TECH SCIENCE CORP 发明人 TANAKA KEIICHI;ODAWARA NARIKAZU
分类号 G01N23/225 主分类号 G01N23/225
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