发明名称 SUIT PATTERN AND MEASURING DEVICE FOR THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a suit pattern of a style that can be fitted to a wearer of various body types.SOLUTION: A suit pattern is configured as follows: the point specified by moving forward only by the length obtained by multiplying 0.177±0.005 to a half of a length of a chest measurement from the back core wire of a back portion, and moving up vertically only by the length of about a quarter of the moving length from the point moved further, is assumed as a virtual base point after the left right shoulders; the point specified by the intersection point between a vertical line of a position of 0.56±0.05 times of the length reaching the front end edge of the sleeve hole part from the front body front end edge and an absolute horizontal line from the left right shoulder front and back base point is assumed as a virtual base point of the front left/right shoulder; a line connected with the notch front and back end of the sleeve hole at a constant adjusting angle from the virtual base point of the front and back left/right shoulder is assumed as a left/right front and rear shoulder ridge lines; and the front and rear shoulder ridge lines are bonded and sewn, respectively.</p>
申请公布号 JP2015120985(A) 申请公布日期 2015.07.02
申请号 JP20130264668 申请日期 2013.12.20
申请人 YPSILON JAPAN CO LTD 发明人 FUNABASHI YUKIHIKO
分类号 A41H3/00;A41D1/02;A41H1/02 主分类号 A41H3/00
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