发明名称 LIGHTING TEST DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a lighting test device that can maintain positional immobility in a lighting test even when the size of a light emitting element is reduced.SOLUTION: A lighting test device 1 moves a holding part 21 holding a light emitting element W to a lighting test position. At the lighting test position, a probe pin is inserted into a through-hole of the holding part 21 from the lower part of the holding part 21, and the probe pin is brought into contact with the light emitting element W on the holding part 21. Further, at the lighting test position, the light emitting element W on the holding part 21 is held from side surfaces by a clump part, and static frictional force for resisting the contact load of the probe pin is applied to the light emitting element W. Then, a light receiving device positioned above the holding part 21 receives light emitted from the light emitting element W.</p>
申请公布号 JP2015121456(A) 申请公布日期 2015.07.02
申请号 JP20130265213 申请日期 2013.12.24
申请人 UENO SEIKI KK 发明人 MASUDA TAKAYUKI
分类号 G01M11/00;G01J1/00;H01L21/677;H01L21/683;H01L33/00 主分类号 G01M11/00
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