发明名称 |
COMPONENT OF A PLASMA PROCESSING APPARATUS INCLUDING AN ELECTRICALLY CONDUCTIVE AND NONMAGNETIC COLD SPRAYED COATING |
摘要 |
A semiconductor plasma processing apparatus used to process semiconductor components comprises a plasma processing chamber, a process gas source in fluid communication with the plasma processing chamber for supplying a process gas into the plasma processing chamber, a RF energy source adapted to energize the process gas into the plasma state in the plasma processing chamber, and a vacuum port for exhausting process gas from the plasma processing chamber. The semiconductor plasma processing apparatus further comprises at least one component wherein the component has a body which has a relative magnetic permeability of about 70,000 or greater and a cold sprayed electrically conductive and nonmagnetic coating on a surface of the body wherein the coating has a thickness greater than the skin depth of a RF current configured to flow therethrough during plasma processing. |
申请公布号 |
US2015187615(A1) |
申请公布日期 |
2015.07.02 |
申请号 |
US201414578979 |
申请日期 |
2014.12.22 |
申请人 |
Lam Research Corporation |
发明人 |
Daugherty John;Shih Hong;Amadio Anthony;Stevenson Tom;Xu Lin;Kerns John Michael;O'Neill Robert Griffith;Castillo Sonia |
分类号 |
H01L21/67;H01L21/02;C25D11/02;H01L21/3065;C23C24/04;C23C22/73 |
主分类号 |
H01L21/67 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor plasma processing apparatus, comprising:
a plasma processing chamber in which semiconductor components are processed; a process gas source in fluid communication with the plasma processing chamber for supplying a process gas into the plasma processing chamber; a RF energy source adapted to energize the process gas into the plasma state in the plasma processing chamber; a vacuum port for exhausting process gas from the plasma processing chamber; and at least one component wherein the component has a body which has a relative magnetic permeability of about 70,000 or greater and a cold sprayed electrically conductive and nonmagnetic coating on a surface of the body wherein the coating has a thickness greater than the skin depth of a RF current configured to flow therethrough during plasma processing. |
地址 |
Fremont CA US |