发明名称 COMPONENT OF A PLASMA PROCESSING APPARATUS INCLUDING AN ELECTRICALLY CONDUCTIVE AND NONMAGNETIC COLD SPRAYED COATING
摘要 A semiconductor plasma processing apparatus used to process semiconductor components comprises a plasma processing chamber, a process gas source in fluid communication with the plasma processing chamber for supplying a process gas into the plasma processing chamber, a RF energy source adapted to energize the process gas into the plasma state in the plasma processing chamber, and a vacuum port for exhausting process gas from the plasma processing chamber. The semiconductor plasma processing apparatus further comprises at least one component wherein the component has a body which has a relative magnetic permeability of about 70,000 or greater and a cold sprayed electrically conductive and nonmagnetic coating on a surface of the body wherein the coating has a thickness greater than the skin depth of a RF current configured to flow therethrough during plasma processing.
申请公布号 US2015187615(A1) 申请公布日期 2015.07.02
申请号 US201414578979 申请日期 2014.12.22
申请人 Lam Research Corporation 发明人 Daugherty John;Shih Hong;Amadio Anthony;Stevenson Tom;Xu Lin;Kerns John Michael;O'Neill Robert Griffith;Castillo Sonia
分类号 H01L21/67;H01L21/02;C25D11/02;H01L21/3065;C23C24/04;C23C22/73 主分类号 H01L21/67
代理机构 代理人
主权项 1. A semiconductor plasma processing apparatus, comprising: a plasma processing chamber in which semiconductor components are processed; a process gas source in fluid communication with the plasma processing chamber for supplying a process gas into the plasma processing chamber; a RF energy source adapted to energize the process gas into the plasma state in the plasma processing chamber; a vacuum port for exhausting process gas from the plasma processing chamber; and at least one component wherein the component has a body which has a relative magnetic permeability of about 70,000 or greater and a cold sprayed electrically conductive and nonmagnetic coating on a surface of the body wherein the coating has a thickness greater than the skin depth of a RF current configured to flow therethrough during plasma processing.
地址 Fremont CA US