APPARATUS AND METHOD OF DETECTING SCAP DEFECT

摘要

Provided are a device and a method for detecting a scab defect. The device comprises: a first binarizing unit for generating a first binary image by performing dark binarization on an original image obtained by photographing a hot material; a second binarizing unit for generating a second binary image by performing bright binarization on the original image; a third binarizing unit for performing sobel filtering on the original image, and generating a third binary image by performing bright binarization on the sobel-filtered original image; and a defect detecting unit for detecting, as a scab defect, a blob obtained by adding a dark blob extracted from the first binary image and the third binary image and a bright blob extracted from the second binary image and the third binary image. Accordingly, a scab defect can be accurately detected.