发明名称 METHOD AND APPARATUS FOR MEASURING PERFORMANCE OF ELECTRONIC DEVICE
摘要 <p>A method and an apparatus for measuring performance of an electronic device are provided. The apparatus includes an electromagnetic wave measuring device for measuring an actual level of an electromagnetic wave of an electronic device, and an analysis controller for applying a previously stored level change value to the actual level of the electromagnetic wave to compute a measured level of the electromagnetic wave. The method and the apparatus for measuring performance of an electronic device can easily measure an electromagnetic wave level of the electronic device without using a device suggested by an international standard.</p>
申请公布号 EP2764374(A4) 申请公布日期 2015.07.01
申请号 EP20120839036 申请日期 2012.10.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JUNG MIN;SEO, KEON YOUNG;YANG, KWANG MO;KANG, BYEONG HWAN;PARK, BONG HEE
分类号 G01R29/08;G01R31/00;H04M1/24 主分类号 G01R29/08
代理机构 代理人
主权项
地址