发明名称 温度不敏感之测试装置与方法;Temperature insensitive testing device and method
摘要 本发明揭露了一种温度不敏感之测试装置与方法,能够经由一传输线输出一测试讯号并产生一测试结果。所述装置之一实施例包含:一传送端测试序列产生电路,用来产生一测试序列;一传送电路,用来依据一传送时脉处理该测试序列以产生一测试讯号;一接收电路,用来依据一接收时脉处理该测试讯号之一回音讯号以产生一数位回音讯号;一关联值产生电路,用来依据该测试序列以及该数位回音讯号执行一关联运算以产生复数个关联值,其中该复数个关联值包含一最大关联值;以及一判断电路,用来判断该最大关联值与至少一门槛值之关系是否满足至少一预设条件,据以产生一判断结果。上述传送时脉之频率被限制小于一预设频率,藉此使上述最大关联值的变化于传输线之一温度变化范围内小于一预设范围。; a transmission circuit to process the test sequence according to a transmission clock and thereby generate a test signal; a reception circuit to process an echo of the test signal according to a reception clock and thereby generate a digital echo signal; a correlation-value generating circuit to generate a plurality of correlation values according to the test sequence and the digital echo signal in which the correlation values include a maximum correlation value; and a decision circuit to determine whether the relation between the maximum correlation value and at least one threshold satisfies at least one predetermined condition, so as to generate a decision result, wherein the frequency of the transmission clock is lower than a predetermined clock which makes the variation of the maximum correlation value be confined to a predetermined range provided that the temperature variation of the transmission cable is within a temperature range.
申请公布号 TW201525424 申请公布日期 2015.07.01
申请号 TW102148910 申请日期 2013.12.27
申请人 瑞昱半导体股份有限公司 REALTEK SEMICONDUCTOR CORPORATION 发明人 苏敬尧 SU, CHING YAO;黄亮维 HUANG, LIANG WEI;王士玮 WANG, SHIH WEI;庄胜富 CHUANG, SHENG FU
分类号 G01D3/028(2006.01) 主分类号 G01D3/028(2006.01)
代理机构 代理人 林昱礽郑庆鸿
主权项
地址 新竹市新竹科学园区创新二路2号 TW