Multipoint offset sampling deformation techniques

摘要

Systems and methods for performing MOS skin deformations are provided. In one example process, the in vector of a MOS transform may be manually configured by a user. In another example process, a slide/bulge operation may be configured to depend on two or more MOS transforms. Each of the MOS transforms may be assigned a weight that represents the transform's contribution to the overall slide/bulge. In yet another example process, a bulge operation for a MOS vertex may be performed in a direction orthogonal to the attached MOS curve regardless of the direction of the attachment vector. In yet another example process, a ghost transform may be inserted into a MOS closed curve and used to calculate skin deformations associated with first transform of the MOS closed curve.