发明名称 |
Device for detecting a laser attack in an integrated circuit chip |
摘要 |
A device for detecting a laser attack made on an integrated circuit chip comprises a bipolar transistor of a first type formed in a semiconductor substrate, that bipolar transistor comprising a parasitic bipolar transistor of a second type. A buried region, forming the base of the parasitic bipolar transistor, operates as a detector of the variations in current flowing caused by impingement of laser light on the substrate. |
申请公布号 |
US9070697(B2) |
申请公布日期 |
2015.06.30 |
申请号 |
US201414531025 |
申请日期 |
2014.11.03 |
申请人 |
STMicroelectronics (Rousset) SAS |
发明人 |
Marinet Fabrice;Fort Jimmy;Sarafianos Alexandre;Mercier Julien |
分类号 |
H01L29/00;H01L23/00;H01L29/732;H01L27/092;H01L27/06 |
主分类号 |
H01L29/00 |
代理机构 |
Gardere Wynne Sewell LLP |
代理人 |
Gardere Wynne Sewell LLP |
主权项 |
1. A circuit, comprising:
a substrate of a first conductivity type; a buried region of a second conductivity type; an encircling region of the second conductivity type extending from a top surface of the substrate to contact the buried region; a well region of the first conductivity type surrounded by said encircling region and said buried region; a surface region of the second conductivity type formed in said well region; wherein the surface region, well region and buried region form a vertical bipolar transistor of a first type; wherein the vertical bipolar transistor includes a parasitic bipolar transistor of a second type; wherein a base terminal of said parasitic bipolar transistor is provided by said buried region; and wherein said buried region detects laser beam impingement on said substrate. |
地址 |
Rousset FR |