发明名称 TESTING METHOD AND TESTING SYSTEM OF DEVICE UNDER TEST FOR WEAPON
摘要 <p>The present invention relates to an integrated testing system for testing a plurality of weapons by using one testing system. A system is provided to perform tests of weapons different from each other according to inputs of test scenarios. Accordingly, the test procedure is simplified, and test management is simplified, thereby improving the convenience for system use and operation of a test user. In addition, since each test execution file′s content may not be stored in each device, it is possible to reduce the volume of the testing system.</p>
申请公布号 KR20150072992(A) 申请公布日期 2015.06.30
申请号 KR20130160765 申请日期 2013.12.20
申请人 LIG NEX1 CO., LTD. 发明人 CHO, DONG HOON;LEE, DONG HUN;KIM, SANG YEOL
分类号 F41A33/00;F41G3/32;F42B35/00 主分类号 F41A33/00
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