发明名称 Structure for interconnecting copper with low dielectric constant medium and the integration method thereof
摘要 The present invention belongs to the technical field of semiconductor devices, and discloses a structure for interconnecting a medium of low dielectric constant with copper and the integration method thereof. It includes: using a combination of copper interconnections and air gaps to reduce capacity, and a special structure to support copper conductors so as to maintain the shape of copper conductors after removing the medium. The advantage of the present invention is that it can realize the complete air gap structure without short circuit or disconnection of copper conductors as well as the complete air gap structure with long conductors, thus reducing RC delay.
申请公布号 US9070689(B2) 申请公布日期 2015.06.30
申请号 US201113381182 申请日期 2011.04.08
申请人 Fudan University 发明人 Wang Pengfei;Zhang Wei
分类号 H01L23/535;H01L21/768;H01L23/532 主分类号 H01L23/535
代理机构 Collard & Roe, P.C. 代理人 Collard & Roe, P.C.
主权项 1. A structure for copper interconnection with a medium of low dielectric constant includes at least one metal conductor and a plurality of insulator supporting structures under each of the metal conductors, the said insulator supporting structures are used for supporting the respective metal conductors, wherein holes are configured between the metal conductors and also between the insulator supporting structures which are located under the same metal conductor and are used for supporting it.
地址 Shanghai CN