发明名称 Methods for testing wireless electronic devices using automatic self-test mode
摘要 A device under test (DUT) may be tested using a radio-frequency test station. The DUT may include at least one antenna, wireless communications circuitry associated with the antenna, and other peripheral components such as a camera module, a display module, and audio circuitry. The test station may include a shielded enclosure in which the DUT is placed during testing. The DUT need not be electrically wired to any test equipment. The DUT may be configured to operate in self test mode. The DUT may be configured to obtain baseline noise floor measurements while all the peripheral components are deactivated and may be configured to obtain elevated noise floor measurements while selectively activating desired subsets of the peripheral components. The difference between the elevated and baseline noise floor measurements may be computed to determine whether at least some of the peripheral components negatively impact the antenna performance by an excessive amount.
申请公布号 US9069037(B2) 申请公布日期 2015.06.30
申请号 US201213359292 申请日期 2012.01.26
申请人 Apple Inc. 发明人 Yu Qishan;Thoma Jeffrey M.;Sorensen Robert S.
分类号 G01R31/28;H04M1/24 主分类号 G01R31/28
代理机构 Treyz Law Group 代理人 Treyz Law Group ;Tsai Jason;Guihan Joseph F.
主权项 1. A method for testing an electronic device under test that contains wireless communications circuitry and peripheral input-output devices, the method comprising: while each of the peripheral input-output devices is turned off, using the wireless communications circuitry to obtain a first radio-frequency power level measurement at a selected frequency channel and a first radio frequency power level measurement at an additional frequency channel; after the wireless communications circuitry has obtained the first radio frequency power level measurement at the selected frequency channel and the first radio frequency power level measurement at the additional frequency channel, while at least one of the peripheral input-output devices is turned on, using the wireless communications circuitry to obtain a second radio frequency power level measurement at the selected frequency channel; and characterizing radio-frequency performance of the electronic device under test based on the first and second radio frequency power level measurements at the selected channel.
地址 Cupertino CA US