| 主权项 |
1. A mode switching circuit structured to operate with an eddy current probe testing apparatus, said eddy current probe testing apparatus having a signal producing device, an output device, a ground bus, and an eddy current probe, said signal producing device structured to produce at least one test signal having a frequency, said output device structured to convert at least one output signal to a displayable format, said eddy current probe structured to operate in an first mode and a second mode to detect defects in a body having a surface, said eddy current probe having a first coil and a second coil, said first coil extending in a plane substantially perpendicular to said body surface, said second coil extending in a in a plane substantially perpendicular to said body surface and to said first coil, said first coil having a first terminal and a second terminal, said second coil having a first terminal and a second terminal, said mode switching circuit comprising:
a switch assembly having a plurality of switches structured to provide electrical signals from said signal producing device to said first coil and said second coil, said plurality of switches structured to move rapidly between a first configuration, wherein said eddy current probe acts in a driver pick-up mode, and a second configuration, wherein said eddy current probe acts in an impedance mode, whereby said eddy current probe acts in both modes concurrently. |
