Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico

摘要

The invention relates to a microelectronic sensor device for the examination of target particles (1) that are bound to binding sites (3) at the binding surface (12) of a carrier (11). In a preferred embodiment, an input light beam (L1) is transmitted into the carrier (11), where a frustrated total internal reflection (FTIR) takes place at the binding surface (12). The amount of light in a resulting output light beam (L2) is detected by a light detector (31) and provides information about the presence of target particles at the binding surface. Moreover, an actuation unit (50) induces movements of the bound target particles (1) by an interaction with a magnetic field (B) or an electric field, particularly with a given modulation frequency (COIn), such that by a demodulation of the detector signal (S) effects of the target particles can be distinguished from background.