发明名称 |
X-ray imaging apparatus |
摘要 |
An X-ray imaging apparatus for imaging an object to be inspected includes a grating that forms a periodic pattern using an X-ray from an X-ray source and a detector that detects the periodic pattern. In the X-ray imaging apparatus, when θ1 is an angle formed between a first direction, which is a periodic direction of the periodic pattern in a plane that is perpendicular to an optical axis of the X-ray, and a line parallel to an X-ray receiving surface of the detector in the plane, and θ2 is a grazing angle of the X-ray relative to the X-ray receiving surface,;1sin2θ1sin2θ2+cos2θ1>2
holds. Also in the X-ray imaging apparatus, an angle formed between a surface of the grating and the optical axis of the X-ray is from 45 to 90°. |
申请公布号 |
US9068919(B2) |
申请公布日期 |
2015.06.30 |
申请号 |
US201313763325 |
申请日期 |
2013.02.08 |
申请人 |
Canon Kabushiki Kaisha |
发明人 |
Handa Soichiro |
分类号 |
G01N23/04;A61B6/00;G21K1/02;A61B6/06 |
主分类号 |
G01N23/04 |
代理机构 |
Canon USA Inc. IP Division |
代理人 |
Canon USA Inc. IP Division |
主权项 |
1. An X-ray imaging apparatus for imaging an object to be inspected, the apparatus comprising:
a grating that forms a periodic pattern using an X-ray from an X-ray source; and a detector that detects the periodic pattern, wherein, when θ1 is an angle formed between a first direction and a line, the first direction being a periodic direction of the periodic pattern in a plane perpendicular to an optical axis of the X-ray, the line being parallel to an X-ray receiving surface of the detector in the plane, and θ2 is a grazing angle of the X-ray relative to the X-ray receiving surface,1sin2θ1sin2θ2+cos2θ1>2holds, and
wherein an angle formed between a surface of the grating and the optical axis of the X-ray is from 45 to 90°. |
地址 |
Tokyo JP |