发明名称 X-ray imaging apparatus
摘要 An X-ray imaging apparatus for imaging an object to be inspected includes a grating that forms a periodic pattern using an X-ray from an X-ray source and a detector that detects the periodic pattern. In the X-ray imaging apparatus, when θ1 is an angle formed between a first direction, which is a periodic direction of the periodic pattern in a plane that is perpendicular to an optical axis of the X-ray, and a line parallel to an X-ray receiving surface of the detector in the plane, and θ2 is a grazing angle of the X-ray relative to the X-ray receiving surface,;1sin2⁢θ1⁢sin2⁢θ2+cos2⁢θ1>2 holds. Also in the X-ray imaging apparatus, an angle formed between a surface of the grating and the optical axis of the X-ray is from 45 to 90°.
申请公布号 US9068919(B2) 申请公布日期 2015.06.30
申请号 US201313763325 申请日期 2013.02.08
申请人 Canon Kabushiki Kaisha 发明人 Handa Soichiro
分类号 G01N23/04;A61B6/00;G21K1/02;A61B6/06 主分类号 G01N23/04
代理机构 Canon USA Inc. IP Division 代理人 Canon USA Inc. IP Division
主权项 1. An X-ray imaging apparatus for imaging an object to be inspected, the apparatus comprising: a grating that forms a periodic pattern using an X-ray from an X-ray source; and a detector that detects the periodic pattern, wherein, when θ1 is an angle formed between a first direction and a line, the first direction being a periodic direction of the periodic pattern in a plane perpendicular to an optical axis of the X-ray, the line being parallel to an X-ray receiving surface of the detector in the plane, and θ2 is a grazing angle of the X-ray relative to the X-ray receiving surface,1sin2⁢θ1⁢sin2⁢θ2+cos2⁢θ1>2holds, and wherein an angle formed between a surface of the grating and the optical axis of the X-ray is from 45 to 90°.
地址 Tokyo JP