发明名称 |
COMPOSITION FOR FORMING OVERLAY FILM, AND RESIST PATTERN FORMATION METHOD USING SAME |
摘要 |
[Object] To provide a composition for forming a topcoat layer enabling to produce a pattern excellent in roughness and in pattern shape; and also to provide a pattern formation method employing that. [Means for solving] A composition for forming a topcoat layer, comprising a solvent and a fullerene derivative having a hydrophilic group; and also a method of forming a pattern by casting the above composition on a resist surface and then by subjecting it to exposure and development. [Selected drawing] None |
申请公布号 |
SG11201503912W(A) |
申请公布日期 |
2015.06.29 |
申请号 |
SG11201503912W |
申请日期 |
2013.12.12 |
申请人 |
AZ ELECTRONIC MATERIALS (LUXEMBOURG) S.A.R.L. |
发明人 |
WANG XIAOWEI;SUZUKI MASATO;OKAYASU TETSUO;PAWLOWSKI GEORG;XIAOWEI WANG;MASATO SUZUKI;TETSUO OKAYASU;GEORG PAWLOWSKI |
分类号 |
G03F7/11;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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