发明名称 COMPOSITION FOR FORMING OVERLAY FILM, AND RESIST PATTERN FORMATION METHOD USING SAME
摘要 [Object] To provide a composition for forming a topcoat layer enabling to produce a pattern excellent in roughness and in pattern shape; and also to provide a pattern formation method employing that. [Means for solving] A composition for forming a topcoat layer, comprising a solvent and a fullerene derivative having a hydrophilic group; and also a method of forming a pattern by casting the above composition on a resist surface and then by subjecting it to exposure and development. [Selected drawing] None
申请公布号 SG11201503912W(A) 申请公布日期 2015.06.29
申请号 SG11201503912W 申请日期 2013.12.12
申请人 AZ ELECTRONIC MATERIALS (LUXEMBOURG) S.A.R.L. 发明人 WANG XIAOWEI;SUZUKI MASATO;OKAYASU TETSUO;PAWLOWSKI GEORG;XIAOWEI WANG;MASATO SUZUKI;TETSUO OKAYASU;GEORG PAWLOWSKI
分类号 G03F7/11;H01L21/027 主分类号 G03F7/11
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