| 摘要 |
FIELD: electricity.SUBSTANCE: invention is related to the sphere of microelectronics and may be used for improved quality of burn-in test for integrated microcircuits. Essence of the invention: sequence of voltage pulses is supplied to supply outputs and earthing output of an integrated microcircuit. Rising edge of pulses supplied to earthing output is generated with delay in regard to rising edge of pulse supplied to supply output. Trailing edge of pulses at earthing output is generated before generation of trailing edge of pulse at supply output.EFFECT: improved reliability of integrated microcircuits.4 dwg |
