发明名称 DEFECT DETECTION DEVICE AND METHOD FOR POLARIZATION FILM
摘要 PROBLEM TO BE SOLVED: To provide a defect detection device and method for a polarization film. ! SOLUTION: The defect detection device 100 for a polarization film includes: a receiving unit 110 for receiving an inspection result for a polarization film inspected by an automatic optical inspection machine; and a detection unit 130 for analyzing the inspection result and detecting the defect of the polarization film. On the basis of two or more parameters of the defect type (Defect Type), delta X (Dx), delta Y (Dy), area (Area), density (Density), size (Size), peak (Peak), and thickness (Thickness), the detection unit determines that the defect form of the polarization film is at least one of the bonded foreign matter, bonded air bubble, foreign matter, bright point, scratch, association bright point, and one string. ! COPYRIGHT: (C)2015,JPO&INPIT
申请公布号 JP2015118089(A) 申请公布日期 2015.06.25
申请号 JP20140251909 申请日期 2014.12.12
申请人 DONGWOO FINE-CHEM CO LTD 发明人 HEO JAE YOUNG ; PARK JAE HYUN
分类号 G01N21/89;G01N21/892 主分类号 G01N21/89
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