发明名称 SEMICONDUCTOR STRUCTURE FOR ELECTROSTATIC DISCHARGE PROTECTION
摘要 A semiconductor structure includes a P well formed on a P type substrate; a first N type electrode area formed on a central region of the P well; a first insulating area formed on the P well and surrounding the first N type electrode area; a second N type electrode area formed on the P well and surrounding the first insulating area; a second insulating area formed on the P well and surrounding the second N type electrode area; and a P type electrode area formed on the P well and surrounding the second insulating area; wherein periphery outlines of the first N type electrode area and the second N type electrode area are both 8K sided polygons or circles, and K is a positive integer.
申请公布号 US2015179629(A1) 申请公布日期 2015.06.25
申请号 US201414306253 申请日期 2014.06.17
申请人 Advanced Analog Technology, Inc. 发明人 Ko Chun-Chung;Wu Chih-Lun;Lin Shuo-Yen
分类号 H01L27/02;H01L23/60 主分类号 H01L27/02
代理机构 代理人
主权项 1. A semiconductor structure for electrostatic discharge protection, comprising: a P well formed on a P type substrate; a first N type electrode area formed on a central region of the P well; a first insulating area formed on the P well and surrounding the first N type electrode area; a second N type electrode area formed on the P well and surrounding the first insulating area; a second insulating area formed on the P well and surrounding the second N type electrode area; and a P type electrode area formed on the P well and surrounding the second insulating area; wherein periphery outlines of the first N type electrode area and the second N type electrode area are 8K sided polygons or circles, and K is a positive integer.
地址 Hsinchu TW