发明名称 |
ANTI-FUSE ARRAY OF SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME |
摘要 |
An anti-fuse array of a semiconductor device and a method for forming the same are disclosed. The anti-fuse array for a semiconductor device includes a first-type semiconductor substrate formed to define an active region by a device isolation region, a second-type impurity implantation region formed in the active region, a first-type channel region isolated from the semiconductor substrate by the second-type impurity implantation region, a gate electrode formed over the channel region, and a first metal contact formed over the second-type impurity implantation region. |
申请公布号 |
US2015179526(A1) |
申请公布日期 |
2015.06.25 |
申请号 |
US201514638929 |
申请日期 |
2015.03.04 |
申请人 |
SK hynix Inc. |
发明人 |
SUNG Min Chul |
分类号 |
H01L21/8234;H01L27/118;H01L23/525 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing an anti-fuse array of a semiconductor device comprising:
forming an active region in a first-type semiconductor substrate by a device isolation region; depositing a gate insulation film and a gate electrode over the active region; forming a spacer film over a sidewall of the gate electrode; forming second-type first and second impurity implantation regions, using the gate electrode and the gate spacer film as a mask, in the active region and along a sidewall of the device isolation region; and forming a first metal contact over the first impurity implantation region. |
地址 |
Icheon KR |