发明名称 HEIGHT MEASURING APPARATUS AND METHOD THEREOF
摘要 A height measuring apparatus and a method thereof are disclosed. The disclosed method is suitable for an indoor environment. The disclosed method comprises emitting a first laser to a ceil via a first light path, determining whether a first reflective light corresponding to the first laser is received, emitting a second laser to an object via a second light path reflected by the ceil, determining whether a second reflective light corresponding to the second laser is received, calculating a first length according to a first data corresponding to the first reflective light, calculating a second length according to a second data corresponding to the second reflective light, and calculating an object height of the object according to the first length and the second length.
申请公布号 US2015176975(A1) 申请公布日期 2015.06.25
申请号 US201414275516 申请日期 2014.05.12
申请人 Wistron Corp. 发明人 CHANG Yao-Tsung;LI Chia-Hsien;LIN Pai-Yang;CHUNG Shun-Chi
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
主权项 1. A method for measuring height applicable for an environment with a first reflecting surface, the method comprises: emitting a first laser beam along a first light path; determining whether a first reflecting light resulting from the first laser beam reflected by the first reflecting surface is received; calculating a first length according to a first piece of data corresponding to the first reflecting light when the first reflecting light is received; emitting a second laser beam along a second light path; determining whether a second reflecting light resulting from the second laser beam reflected by both of the first reflecting surface and an object under test is received; calculating a second length according to a second piece of data corresponding to the second reflecting light when the second reflecting light is received; and calculating a height of the object under test at least according to the first length and the second length.
地址 New Taipei City TW