A probe card testing apparatus according to an embodiment of the present invention comprises: a substrate; a first insulating layer which covers the substrate; and a first detecting part which is formed on the first insulating layer and detects physical defects of a probe needle, wherein the first detecting part comprises: a ground detecting part which has a first conducting pattern defining a number of opening parts which detect defects of a ground probe and expose a part of the first insulating layer; and a signal and power supply detecting part which has a second conducting pattern defining a number of opening parts which detect defects of a signal probe and a power supply probe and expose a part of the first insulating layer.
