发明名称 EXTENDED FUSE REPROGRAMMABILITY MECHANISM
摘要 An apparatus includes a semiconductor fuse array, disposed on a die, into which is programmed configuration data. The semiconductor fuse array has a first plurality of semiconductor fuses and a second plurality of semiconductor fuses. The first plurality of semiconductor fuses is configured to store the configuration data in an encoded and compressed format. The second plurality of semiconductor fuses is configured to store first fuse correction data that indicates locations and values corresponding to a first one or more fuses within the first plurality of fuses whose states are to be changed from that which was previously stored.
申请公布号 US2015179276(A1) 申请公布日期 2015.06.25
申请号 US201514635040 申请日期 2015.03.02
申请人 VIA ALLIANCE SEMICONDUCTOR CO., LTD. 发明人 HENRY G. GLENN;JAIN DINESH K.
分类号 G11C17/18;G11C17/16 主分类号 G11C17/18
代理机构 代理人
主权项 1. An apparatus for reprogramming an integrated circuit device, the apparatus comprising: a semiconductor fuse array, disposed on a die, into which is programmed configuration data, said semiconductor fuse array comprising: a first plurality of semiconductor fuses, configured to store said configuration data in an encoded and compressed format; anda second plurality of semiconductor fuses, configured to store first fuse correction data that indicates locations and values corresponding to a first one or more fuses within said first plurality of fuses whose states are to be changed from that which was previously stored.
地址 Shanghai CN