发明名称 MICROSTRUCTURES FOR IMPROVED WAFER HANDLING
摘要 Provided herein are high coefficient of friction contact surfaces for transfer of substrates including semiconductor wafers. In certain implementations, the contact surfaces include microstructures that exploit intermolecular surface forces for increased adhesion and friction in the x-y direction during substrate transfer, while allowing easy release in the z-direction without tilting the substrate. Also provided are robot end effectors including the contact surfaces and related high-throughput transfer systems and methods.
申请公布号 US2015174768(A1) 申请公布日期 2015.06.25
申请号 US201314139522 申请日期 2013.12.23
申请人 LAM Research Corporation 发明人 Rodnick Matthew J.
分类号 B25J15/00;B25J11/00;H01L21/677 主分类号 B25J15/00
代理机构 代理人
主权项 1. A contact pad for an end effector, comprising: a contact pad base; and a plurality of structures arrayed on the contact pad base, each structure including a flexible member and a plurality of contact members connected to the flexible member, the flexible member configured to deflect on application of a substrate; and the plurality of contact members configured to adhere to a substrate by van der Waals adhesion.
地址 Fremont CA US