发明名称 Plasma Treatment of Low-K Surface to Improve Barrier Deposition
摘要 Methods and apparatus for processing using a remote plasma source are disclosed. The apparatus includes an outer chamber enclosing a substrate support, a remote plasma source, and a showerhead. A substrate heater can be mounted in the substrate support. A transport system moves the substrate support and is capable of positioning the substrate. The plasma system may be used to generate activated species. The activated species can be used to treat the surfaces of low-k and/or ultra low-k dielectric materials to facilitate improved deposition of diffusion barrier materials.
申请公布号 US2015179509(A1) 申请公布日期 2015.06.25
申请号 US201314135182 申请日期 2013.12.19
申请人 Intermolecular, Inc. 发明人 Limdulpaiboon Ratsamee;Greer Frank;Lang Chi-I;Watanabe J.;Zhu Wenxian
分类号 H01L21/768;H01L21/02 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method comprising: providing a substrate having an inter-metal dielectric layer formed thereon; exposing the inter-metal dielectric layer to activated species, wherein the activated species are generated using a plasma source,wherein the activated species is at least one of O, N, CI, F, or H; and after the exposing, depositing a diffusion barrier layer on the inter-metal dielectric layer using an atomic layer deposition (ALD) process, wherein a nucleation delay for the ALD process is less than 5 cycles.
地址 San Jose CA US
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