发明名称 |
METHOD AND DEVICE FOR THE EXAMINATION OF A SAMPLE USING OPTICAL PROJECTION TOMOGRAPHY |
摘要 |
The invention relates to a method for the examination by tomography of a sample (9). According to said method, a sample (9) is illuminated with an illumination light beam (3), and a transmission light beam (10), which contains the light of the illumination light beam (3) transmitted through the sample (9), is detected by means of a transmission detector (13). The invention further relates to a device for the examination of a sample (9) by tomography. The illumination light beam (3) and the transmission light beam (10) pass through the same lens (7) with opposite propagation directions. |
申请公布号 |
WO2015091713(A1) |
申请公布日期 |
2015.06.25 |
申请号 |
WO2014EP78335 |
申请日期 |
2014.12.17 |
申请人 |
LEICA MICROSYSTEMS CMS GMBH |
发明人 |
KNEBEL, WERNER;FOUQUET, WERNHER;SIECKMANN, FRANK |
分类号 |
G01N21/47;G01N21/64;G02B21/00 |
主分类号 |
G01N21/47 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|