发明名称 Substrate Processing Apparatus and Method of Manufacturing Semiconductor Device
摘要 The substrate processing apparatus includes a reaction chamber configured to accommodate a substrate; a first gas supply unit configured to supply a first process gas containing a silicon element to the substrate; a second gas supply unit configured to supply a second process gas containing a silicon element and a chlorine element to the substrate; an exhaust unit configured to exhaust the first process gas and the second process gas; a cleaning gas bypass supply unit configured to supply a cleaning gas to the exhaust unit; a cleaning monitoring unit installed in the exhaust unit; a gas flow rate control unit configured to adjust an amount of the cleaning gas supplied; and a main control unit configured to control the gas flow rate control unit in response to a signal received from the cleaning gas monitoring unit.
申请公布号 US2015176130(A1) 申请公布日期 2015.06.25
申请号 US201514636712 申请日期 2015.03.03
申请人 Hitachi Kokusai Electric Inc. 发明人 KOSHI Yasunobu;SUZAKI Kenichi;YOSHINO Akihito
分类号 C23C16/52;C23C16/455;H01L21/67;C23C16/44 主分类号 C23C16/52
代理机构 代理人
主权项 1. A substrate processing apparatus comprising: a reaction chamber configured to accommodate a substrate; a first gas supply unit configured to supply a first process gas containing a silicon element to the substrate; a second gas supply unit configured to supply a second process gas containing a silicon element and a chlorine element to the substrate; an exhaust unit configured to exhaust the first process gas and the second process gas; a cleaning gas bypass supply unit configured to supply a cleaning gas to the exhaust unit; a cleaning monitoring unit installed in the exhaust unit; a gas flow rate control unit configured to adjust an amount of the cleaning gas supplied; and a main control unit configured to control the gas flow rate control unit in response to a signal received from the cleaning gas monitoring unit.
地址 Tokyo JP