发明名称 METHOD FOR PRODUCING SEMICONDUCTOR DEVICE
摘要 A method for producing a semiconductor device having a semiconductor element obtained by dividing a semiconductor wafer comprises a temporary securing step of arranging a temporary securing film between a support member and the semiconductor wafer so as to temporarily secure the support member and the semiconductor wafer to each other; a grinding step of grinding a surface on the side opposite from the temporary securing film of the semiconductor wafer temporarily secured to the support member, and a semiconductor wafer peeling step of peeling the temporary securing film from the ground semiconductor wafer, wherein a semiconductor wafer edge-trimmed on an outer peripheral part of a surface opposing the support member is used as the semiconductor wafer, and the temporary securing step arranges the temporary securing film on the inside of the edge-trimmed part.
申请公布号 US2015179494(A1) 申请公布日期 2015.06.25
申请号 US201314411621 申请日期 2013.06.26
申请人 HITACHI CHEMICAL COMPANY, LTD. 发明人 Kawamori Takashi;Makino Tatsuya;Sobue Shogo Young;Hatakeyama Keiichi;Matsuzaki Takayuki
分类号 H01L21/683;H01L21/304;H01L21/78 主分类号 H01L21/683
代理机构 代理人
主权项 1. A method for producing a semiconductor device comprising a semiconductor element obtained by dividing a semiconductor wafer, the method comprising: a temporary securing step of arranging a temporary securing film between a support member and the semiconductor wafer so as to temporarily secure the support member and the semiconductor wafer to each other; a grinding step of grinding a surface on the side opposite from the temporary securing film of the semiconductor wafer temporarily secured to the support member; and a semiconductor wafer peeling step of peeling the temporary securing film from the ground semiconductor wafer; wherein a semiconductor wafer edge-trimmed on an outer peripheral part of a surface opposing the support member is used as the semiconductor wafer; and wherein the temporary securing step arranges the temporary securing film on the inside of the edge-trimmed part.
地址 Chiyoda-ku, Tokyo JP