发明名称 |
Method and Apparatus for Electron Beam Lithography |
摘要 |
A system using an energy beam to expose patterns on a wafer includes first mirror elements, a multiplexer element, and second mirror elements. The first and second mirror elements are dynamically controlled to reflect the energy beam to the wafer. The first mirror elements are configured in a first chain having a first data input and a first data output. The multiplexer element includes a second data input, a third data input, a select input, and a second data output. The third data input is coupled to the first data output. The second mirror elements are configured in a second chain having a fourth data input. |
申请公布号 |
US2015179392(A1) |
申请公布日期 |
2015.06.25 |
申请号 |
US201514618644 |
申请日期 |
2015.02.10 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Che Yu-Chi |
分类号 |
H01J37/02;H01J37/147;H01J37/317 |
主分类号 |
H01J37/02 |
代理机构 |
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代理人 |
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主权项 |
1. A system using an energy beam to expose patterns on a wafer, comprising:
a first plurality of mirror elements; and a second plurality of mirror elements; wherein: the first plurality of mirror elements is configured to expose the wafer using the energy beam; and the second plurality of mirror elements is configured to substitute the first plurality when at least one mirror element of the first plurality is found defective. |
地址 |
Hsin-Chu TW |