发明名称 Method and Apparatus for Electron Beam Lithography
摘要 A system using an energy beam to expose patterns on a wafer includes first mirror elements, a multiplexer element, and second mirror elements. The first and second mirror elements are dynamically controlled to reflect the energy beam to the wafer. The first mirror elements are configured in a first chain having a first data input and a first data output. The multiplexer element includes a second data input, a third data input, a select input, and a second data output. The third data input is coupled to the first data output. The second mirror elements are configured in a second chain having a fourth data input.
申请公布号 US2015179392(A1) 申请公布日期 2015.06.25
申请号 US201514618644 申请日期 2015.02.10
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Che Yu-Chi
分类号 H01J37/02;H01J37/147;H01J37/317 主分类号 H01J37/02
代理机构 代理人
主权项 1. A system using an energy beam to expose patterns on a wafer, comprising: a first plurality of mirror elements; and a second plurality of mirror elements; wherein: the first plurality of mirror elements is configured to expose the wafer using the energy beam; and the second plurality of mirror elements is configured to substitute the first plurality when at least one mirror element of the first plurality is found defective.
地址 Hsin-Chu TW