AUTOMATIC TEST-PATTERN GENERATION FOR MEMORY-SHADOW-LOGIC TESTING

摘要

An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.

主权项

1. A method for automated test pattern generation (ATPG), the method comprising the step of generating a test pattern using respective ATPG memory address locations of a memory coupled to a logic circuit under test.