SYSTEMS AND METHODS TO REDUCE DELAMINATION IN INTEGRATED COMPUTATIONAL ELEMENTS USED DOWNHOLE

摘要

Systems and methods are disclosed for reducing delamination or cracking in a multilayer film stack fabricated on a substrate. The multilayer film stack is designed to optically process a sample fluid interacted electromagnetic radiation to measure various chemical or physical characteristics of a production fluid from a wellbore. Systems and methods measure in situ a characteristic of the multilayer film stack during fabrication and compare the measured characteristic against a reference criterion. The reference criterion has been predetermined to represent an onset of delamination or cracking. If the reference criterion is met, fabrication of the multilayer film stack is modified to reduce the possibility of delamination or cracking. Other systems and methods are presented.