发明名称 半導体装置
摘要 <p>According to one embodiment, a semiconductor device includes a first semiconductor layer of a first conductivity type, a second semiconductor layer of a first conductivity type, a third semiconductor layer of a second conductivity type, an isolation layer, and a guard ring layer of the second conductivity type. The second semiconductor layer is provided on the first semiconductor layer. The third semiconductor layer is provided on the second semiconductor layer to be joined to the second semiconductor layer. The isolation layer surrounds a periphery of the third semiconductor layer and is deeper than the third semiconductor layer. The guard ring layer is provided between the third semiconductor layer and the isolation layer, adjacent to the third semiconductor layer, and deeper than the third semiconductor layer.</p>
申请公布号 JP5739826(B2) 申请公布日期 2015.06.24
申请号 JP20120011471 申请日期 2012.01.23
申请人 发明人
分类号 H01L21/329;H01L29/06;H01L29/861;H01L29/866;H01L29/868 主分类号 H01L21/329
代理机构 代理人
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