发明名称 Ultraviolet sensor and method for manufacturing the same
摘要 An ultraviolet sensor has a p-type semiconductor layer composed of a solid solution of NiO and ZnO, and an n-type semiconductor layer composed of ZnO and joined to the p-type semiconductor layer such that a part of the surface of the p-type semiconductor layer is exposed. In the p-type semiconductor layer, trivalent Ni is contained in a crystal grain in a state of being solid-solved with the solid solution of NiO and ZnO. The trivalent Ni can be contained in the crystal grain of the p-type semiconductor layer by adding NiOOH to NiO and ZnO, and firing the resulting mixture. Thereby, an inexpensive ultraviolet sensor capable of being downsized, which can easily detect the intensity of ultraviolet light by a photovoltaic power without utilizing a peripheral circuit can be realized.
申请公布号 US9064990(B2) 申请公布日期 2015.06.23
申请号 US201213706435 申请日期 2012.12.06
申请人 MURATO MANUFACTURING CO., LTD. 发明人 Nakamura Kazutaka
分类号 H01L31/0296;H01L31/109;H01L31/18;H01L31/0328 主分类号 H01L31/0296
代理机构 Arent Fox LLP 代理人 Arent Fox LLP
主权项 1. An ultraviolet sensor comprising: a p-type semiconductor layer composed of a solid solution of NiO and ZnO; and an n-type semiconductor layer composed of ZnO and joined to the p-type semiconductor layer, wherein the p-type semiconductor layer contains trivalent Ni.
地址 Nagaokakyo-Shi, Kyoto-Fu JP