| 发明名称 | Interface for a test system | ||
| 摘要 | An example test system includes: a pin electronics board for exchanging signals with a device under test (DUT), where the pin electronics board includes first electrical contacts; an interposer between the pin electronics board and a paddle board, where the paddle board includes second electrical contacts, and where the interposer includes electrical connectors for use in establishing electrical pathways between the first electrical contacts and the second electrical contacts; and an actuator configured to force the paddle board and the interposer to make contact so as to cause the electrical connectors to contact the second electrical contacts and thereby establish the electrical pathways. | ||
| 申请公布号 | US9063170(B2) | 申请公布日期 | 2015.06.23 |
| 申请号 | US201213728045 | 申请日期 | 2012.12.27 |
| 申请人 | Teradyne, Inc. | 发明人 | Caradonna Michael;Fern Jacob;Wilkinson Stephen |
| 分类号 | G01R1/04;G01R31/28 | 主分类号 | G01R1/04 |
| 代理机构 | Fish & Richardson P.C. | 代理人 | Fish & Richardson P.C. |
| 主权项 | 1. A test system comprising: a pin electronics (PE) board for exchanging signals with a device under test (DUT), the pin electronics board comprising first electrical contacts; an interposer between the pin electronics board and a paddle board, the paddle board comprising second electrical contacts, the interposer comprising electrical connectors for use in establishing electrical pathways between the first electrical contacts and the second electrical contacts; and an actuator configured to force the paddle board and the interposer to make contact so as to cause the electrical connectors to contact the second electrical contacts and thereby establish the electrical pathways. | ||
| 地址 | North Reading MA US | ||