发明名称 Semiconductor device and method for manufacturing same
摘要 Disclosed is a semiconductor device provided with: lower-layer wiring formed on a substrate, an interlayer insulating film covering the lower-layer wiring, and a first upper-layer wiring line (18b) and a second upper-layer wiring line (18c) arranged on the interlayer insulating film and intersecting with the lower-layer wiring, and a level-difference adjustment protrusion is provided between the first upper-layer wiring line (18b) and the second upper-layer wiring line (18c) adjacent to a side section of the lower-layer wiring.
申请公布号 US9064867(B2) 申请公布日期 2015.06.23
申请号 US201113704396 申请日期 2011.04.20
申请人 SHARP KABUSHIKI KAISHA 发明人 Asano Norihisa;Imae Kazuyoshi
分类号 H01L23/48;H01L23/522;G02F1/1368;H01L27/12;H01L29/786;H01L21/768 主分类号 H01L23/48
代理机构 Chen Yoshimura LLP 代理人 Chen Yoshimura LLP
主权项 1. A semiconductor device, comprising: a lower-layer wiring line formed on a substrate; an interlayer insulating film covering the lower-layer wiring line; a first upper-layer wiring line and a second upper-layer wiring line arranged on the interlayer insulating film so as to intersect the lower-layer wiring line; and a level-difference adjustment island-disposed between the first upper-layer wiring line and the second upper-layer wiring line adjacent to a side of the lower-layer wiring line, wherein the level-difference adjustment island includes a first level-difference adjustment island and a second level-difference adjustment island that is formed so as to overlap the first level-difference adjustment island on a side closer to the lower-layer wiring line.
地址 Osaka JP