发明名称 |
Semiconductor device including a drift zone and a drift control zone |
摘要 |
A semiconductor device includes a semiconductor body having a drift zone of a first conductivity type and a drift control zone. A junction termination structure is at a first side of the semiconductor body. A first dielectric is between the drift zone and the drift control zone. A second dielectric is at a second side of the semiconductor body. The drift control zone includes a first drift control subregion of the first conductivity type and a second drift control subregion of a second conductivity type between the first drift control subregion and the second dielectric. |
申请公布号 |
US9064953(B2) |
申请公布日期 |
2015.06.23 |
申请号 |
US201313915934 |
申请日期 |
2013.06.12 |
申请人 |
Infineon Technologies Austria AG |
发明人 |
Mauder Anton;Hirler Franz;Wiedenbauer Otto |
分类号 |
H01L29/66;H01L29/78;H01L29/40;H01L29/06 |
主分类号 |
H01L29/66 |
代理机构 |
Murphy, Bilak & Homiller, PLLC |
代理人 |
Murphy, Bilak & Homiller, PLLC |
主权项 |
1. A semiconductor device, comprising:
a semiconductor body including a drift zone of a first conductivity type and a drift control zone; a junction termination structure at a first side of the semiconductor body; a first dielectric between the drift zone and the drift control zone; a drain electrode at a second side of the semiconductor body; and a second dielectric at the second side of the semiconductor body and in contact with the drain electrode, wherein the drift control zone includes a first drift control subregion of the first conductivity type and a second drift control subregion of a second conductivity type between the first drift control subregion and the second dielectric. |
地址 |
Villach AT |