发明名称 Method of manufacturing a sensor device having a porous thin-film metal electrode
摘要 A method of fabricating a semiconductor sensor device includes providing a substrate, supporting a source region and a drain region with the substrate, forming an insulator layer above the source region and the drain region, and forming a porous metallic gate region above the insulator layer using plasma enhanced atomic layer deposition (PEALD).
申请公布号 US9064800(B2) 申请公布日期 2015.06.23
申请号 US201314132035 申请日期 2013.12.18
申请人 Robert Bosch GmbH 发明人 Feyh Ando;O'Brien Gary;Purkl Fabian;Yama Gary;Samarao Ashwin K.
分类号 H01L21/28;G01N27/414;H01L29/423 主分类号 H01L21/28
代理机构 Maginot Moore & Beck LLP 代理人 Maginot Moore & Beck LLP
主权项 1. A method of fabricating a semiconductor sensor device comprising: providing a substrate; supporting a source region and a drain region with the substrate; forming an insulator layer above the source region and the drain region; and forming a porous metallic gate region above the insulator layer using plasma enhanced atomic layer deposition (PEALD).
地址 Stuttgart DE