发明名称 |
Method of manufacturing a sensor device having a porous thin-film metal electrode |
摘要 |
A method of fabricating a semiconductor sensor device includes providing a substrate, supporting a source region and a drain region with the substrate, forming an insulator layer above the source region and the drain region, and forming a porous metallic gate region above the insulator layer using plasma enhanced atomic layer deposition (PEALD). |
申请公布号 |
US9064800(B2) |
申请公布日期 |
2015.06.23 |
申请号 |
US201314132035 |
申请日期 |
2013.12.18 |
申请人 |
Robert Bosch GmbH |
发明人 |
Feyh Ando;O'Brien Gary;Purkl Fabian;Yama Gary;Samarao Ashwin K. |
分类号 |
H01L21/28;G01N27/414;H01L29/423 |
主分类号 |
H01L21/28 |
代理机构 |
Maginot Moore & Beck LLP |
代理人 |
Maginot Moore & Beck LLP |
主权项 |
1. A method of fabricating a semiconductor sensor device comprising:
providing a substrate; supporting a source region and a drain region with the substrate; forming an insulator layer above the source region and the drain region; and forming a porous metallic gate region above the insulator layer using plasma enhanced atomic layer deposition (PEALD). |
地址 |
Stuttgart DE |