发明名称 |
Photolithography mask method for a wafer, method for producing same, and photolithography method for wafer using the same |
摘要 |
A photolithography mask for a semiconductor wafer. The mask includes a protrusion section that protrudes from a handling section of the mask. An outer shape of the handling section enables handling by a mask aligner device. The protrusion includes a face surface provided at a level which is different from a face surface area of the handling section. |
申请公布号 |
US9063407(B2) |
申请公布日期 |
2015.06.23 |
申请号 |
US201113814882 |
申请日期 |
2011.08.10 |
申请人 |
DISCO CORPORATION |
发明人 |
Bieck Florian;Spiller Sven |
分类号 |
G03F1/50;G03F1/00 |
主分类号 |
G03F1/50 |
代理机构 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. A photolithography mask for a semiconductor wafer, the mask comprising:
a handling section having an outer shape being provided for handling by a mask aligner; a protrusion section that protrudes from the handling section of the mask; and wherein a face surface of the protrusion section is provided at a level which is different from a face surface area of the handling section. |
地址 |
Tokyo JP |