| 摘要 |
PROBLEM TO BE SOLVED: To achieve improved accuracy of alignment in forming a black resist layer. ! SOLUTION: Light collected by each of microlenses is received at a light receiving part, which is not shown, through an opening provided between wirings. Light from an adjacent microlens is blocked by a black resist layer, at a gap between the microlenses, and thereby deterioration in optical characteristics can be prevented and light collecting characteristics can be improved. The present disclosure can be applied, for example, for a solid-state imaging element used in an imaging device. ! COPYRIGHT: (C)2015,JPO&INPIT |
