发明名称 |
LUMINANCE MEASURING METHOD, LUMINANCE MEASURING DEVICE AND IMAGE QUALITY ADJUSTMENT TECHNOLOGY EMPLOYING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a luminance measuring method capable of accurately measuring the luminance of each of pixels while suppressing the overlap of images of pixels on a display panel and the influence of moire on an imaging plane of a camera.SOLUTION: A luminance measuring method includes the steps of: lighting on pixels of a part of a display panel 2 in such a manner that images of pixels on the display panel 2 are not overlapped with each other on an imaging plane of a camera 7 including a solid-state imaging device; capturing an image while enlarging the image until suppressing moire by means of the camera 7; lighting on remaining pixels on the display panel 2 in such a manner that images of pixels on the display panel 2 are not overlapped with each other on the imaging plane; capturing an image while enlarging the image until suppressing the moire by means of the camera 7; and calculating the luminance of all the pixels on the display panel 2 on the basis of the image captured for the partial pixels on the display panel 2 and the image captured for the remaining pixels. |
申请公布号 |
JP2015115726(A) |
申请公布日期 |
2015.06.22 |
申请号 |
JP20130255505 |
申请日期 |
2013.12.10 |
申请人 |
IIX INC |
发明人 |
MURASE HIROSHI |
分类号 |
H04N17/04;G09G3/20;H04N5/225;H04N17/02 |
主分类号 |
H04N17/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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