发明名称 LUMINANCE MEASURING METHOD, LUMINANCE MEASURING DEVICE AND IMAGE QUALITY ADJUSTMENT TECHNOLOGY EMPLOYING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a luminance measuring method capable of accurately measuring the luminance of each of pixels while suppressing the overlap of images of pixels on a display panel and the influence of moire on an imaging plane of a camera.SOLUTION: A luminance measuring method includes the steps of: lighting on pixels of a part of a display panel 2 in such a manner that images of pixels on the display panel 2 are not overlapped with each other on an imaging plane of a camera 7 including a solid-state imaging device; capturing an image while enlarging the image until suppressing moire by means of the camera 7; lighting on remaining pixels on the display panel 2 in such a manner that images of pixels on the display panel 2 are not overlapped with each other on the imaging plane; capturing an image while enlarging the image until suppressing the moire by means of the camera 7; and calculating the luminance of all the pixels on the display panel 2 on the basis of the image captured for the partial pixels on the display panel 2 and the image captured for the remaining pixels.
申请公布号 JP2015115726(A) 申请公布日期 2015.06.22
申请号 JP20130255505 申请日期 2013.12.10
申请人 IIX INC 发明人 MURASE HIROSHI
分类号 H04N17/04;G09G3/20;H04N5/225;H04N17/02 主分类号 H04N17/04
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