发明名称 |
TEMPERATURE MEASUREMENT METHOD, SUBSTRATE PROCESSING SYSTEM, AND MEMBER FOR TEMPERATURE MEASUREMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a temperature measurement method capable of accurately measuring temperature using interference of low-coherence light even when an object whose temperature is to be measured is worn out or deposited with foreign material. ! SOLUTION: A temperature measurement method comprises the steps of: preparing calibration data representing a relationship between a focus ring 25 and an optical path length of a predetermined path; using optical interference of reflection light of low-coherence light when the low-coherence light is actually projected onto the focus ring 25 placed in a substrate processing apparatus 10 to determine the optical path length when the low-coherence light travels through the predetermined path within the focus ring 25; and determining the temperature of the focus ring 25 by comparing the determined optical path length with calibration data. The predetermined path is set such that the low-coherence light enters the focus ring 25 through a back face of the foc |
申请公布号 |
JP2015114313(A) |
申请公布日期 |
2015.06.22 |
申请号 |
JP20130259229 |
申请日期 |
2013.12.16 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KOSHIMIZU CHISHIO ; MATSUDO TATSUO |
分类号 |
G01K11/12;H01L21/3065 |
主分类号 |
G01K11/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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