| 摘要 |
PROBLEM TO BE SOLVED: To provide a discrimination method of surface defect depth of an object to be inspected and a device thereof which accurately and surely discriminate depth of a surface defect existing in the object to be inspected by evaluating the depth of the surface defect of the object to be inspected by using a flaw detection result of the surface defect of the object to be inspected obtained with a magnetic particle flaw detection method and a flaw detection result of surface defect depth of the object to be inspected obtained with a surface wave flaw detection method.SOLUTION: A discrimination method of surface defect depth of an object to be inspected W is for discriminating depth of a surface defect K existing in the object to be inspected W by performing flaw detection on the surface defect K existing on a surface of the object to be inspected W and/or under the surface and evaluating the depth of the surface defect K, performs the flaw detection on the surface defect K of the object to be inspected W by using a magnetic particle flaw detection method, performs flaw detection on the surface defect K of the object to be inspected W by using an ultrasonic flaw detection method in which the frequency of the ultrasonic wave transmitted to the object to be inspected W can be changed and detects depth of the surface defect K, and discriminates presence/absence of the surface defect K of the object to be inspected W and depth of the surface defect K by using the flaw detection result of each surface defect K obtained with the magnetic particle flaw detection method and ultrasonic flaw detection method. |
