发明名称 |
MEASUREMENT APPARATUS AND MEASUREMENT METHOD |
摘要 |
PROBLEM TO BE SOLVED: To easily obtain a measurement value with higher accuracy in a measurement apparatus and a measurement method that obtain an exact measurement value from a response to a signal applied to a specimen.SOLUTION: A measurement method includes the steps of: detecting a response signal from a specimen with respect to a measurement signal by applying the measurement signal to the measurement electrode pair in a state where the specimen and a predetermined reagent are prevented from being reacted with each other using the measurement electrode pair constituted of a pair of measurement electrodes 25; measuring a resistance value of a resistance value grasping part 35 formed using the same material as that of the measurement electrode; and correcting the measurement value obtained by the response signal based on the measured resistance value. |
申请公布号 |
JP2015114153(A) |
申请公布日期 |
2015.06.22 |
申请号 |
JP20130255044 |
申请日期 |
2013.12.10 |
申请人 |
ARKRAY INC |
发明人 |
FUKUDA KAZUO;SATO YOSHIHARU;OKAMI AKIKO |
分类号 |
G01N27/06;G01N27/26;G01N27/327;G01N27/416;G01N33/66 |
主分类号 |
G01N27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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