发明名称 PROCEDE ANTI-EFFETS DE CHARGE POUR LA LITHOGRAPHIE ET LA MICROSCOPIE ELECTRONIQUE.
摘要 A treatment method (100) for avoiding or limiting the charge effects on a supporting member formed by an insulating substrate or a resin and intended to be subjected to electron radiation, characterised in that it comprises the following steps: depositing (101) a non-conductive sacrificial layer (203, 203') on the substrate or the resin, depositing (102) a conductive layer (204, 204') on the sacrificial layer (203, 203'), carrying out electron radiation (103) for lithography or observation, eliminating (104) the sacrificial layer (203, 203') and the conductive layer (204, 204').
申请公布号 FR2982044(B1) 申请公布日期 2015.06.19
申请号 FR20110059890 申请日期 2011.11.02
申请人 UNIVERSITE PARIS SUD 11 发明人 AASSIME ABDELHANIN;PALOMO JOSE;HAMOUDA FREDERIC
分类号 G03F7/09;H01J37/26;H01L21/027 主分类号 G03F7/09
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