发明名称 PARTS OF SEMICONDUCTOR AND DISPLAY EQUIPMENTS WITH IMPROVED ANTI-PLASMA CORROSION AND METHOD IMPROVING ANTI-PLASMA CORROSION OF PARTS
摘要 To solve a problem that the process component of semiconductor or display manufacturing equipment is etched by the exposure of plasma, the present invention relates to a method of processing anti-plasma corrosion of a process component by removing peaks and valleys of the surface of ceramic powder (the surface of a coating layer and the surface of the process component) before and after powder coating is performed on the process component, and the process component with improved anti-plasma corrosion. Provided is a process component of semiconductor or display manufacturing equipment exposed by plasma. A coating layer is formed on the surface of a main body where valleys and peaks are partly or totally removed. Provided is a process component with improved anti-plasma corrosion where valleys and peaks are partly or totally removed on the surface of a coating layer.
申请公布号 KR20150068285(A) 申请公布日期 2015.06.19
申请号 KR20140154200 申请日期 2014.11.07
申请人 FEMVIX;KIM, OK RYUL;KIM, OK MIN 发明人 KIM, OK MIN;KIM, OK RYUL
分类号 H01L21/3065;H01L21/56 主分类号 H01L21/3065
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