发明名称 |
PARTS OF SEMICONDUCTOR AND DISPLAY EQUIPMENTS WITH IMPROVED ANTI-PLASMA CORROSION AND METHOD IMPROVING ANTI-PLASMA CORROSION OF PARTS |
摘要 |
To solve a problem that the process component of semiconductor or display manufacturing equipment is etched by the exposure of plasma, the present invention relates to a method of processing anti-plasma corrosion of a process component by removing peaks and valleys of the surface of ceramic powder (the surface of a coating layer and the surface of the process component) before and after powder coating is performed on the process component, and the process component with improved anti-plasma corrosion. Provided is a process component of semiconductor or display manufacturing equipment exposed by plasma. A coating layer is formed on the surface of a main body where valleys and peaks are partly or totally removed. Provided is a process component with improved anti-plasma corrosion where valleys and peaks are partly or totally removed on the surface of a coating layer. |
申请公布号 |
KR20150068285(A) |
申请公布日期 |
2015.06.19 |
申请号 |
KR20140154200 |
申请日期 |
2014.11.07 |
申请人 |
FEMVIX;KIM, OK RYUL;KIM, OK MIN |
发明人 |
KIM, OK MIN;KIM, OK RYUL |
分类号 |
H01L21/3065;H01L21/56 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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