Provided are a semiconductor device and a method of manufacturing the same. The method of manufacturing the semiconductor device includes: a step of etching a substrate by using a first mask pattern formed on a substrate and forming a trench; a step of forming a preliminary device separation pattern which is filled in the trench and includes a first region and a second region with a first thickness; a step of forming a second mask pattern on the first region; a step of etching a part of the first mask pattern and the upper part of the second region exposed by the second mask pattern, and forming a second region with a second thickness which is less than the first thickness; a step of removing the first and the second mask patterns; and a step of etching the upper part of the first and the second regions and forming a device separation pattern which defines preliminary fin-type active patterns.
申请公布号
KR20150068138(A)
申请公布日期
2015.06.19
申请号
KR20130153989
申请日期
2013.12.11
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHOI, YONG JOON;KIM, MYEONG CHEOL;KIM, CHEOL;SEONG, GEUM JUNG;LEE, HAK SUN;JUNG, HAE GEON;HAN, JI EUN