发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 Provided are a semiconductor device and a method of manufacturing the same. The method of manufacturing the semiconductor device includes: a step of etching a substrate by using a first mask pattern formed on a substrate and forming a trench; a step of forming a preliminary device separation pattern which is filled in the trench and includes a first region and a second region with a first thickness; a step of forming a second mask pattern on the first region; a step of etching a part of the first mask pattern and the upper part of the second region exposed by the second mask pattern, and forming a second region with a second thickness which is less than the first thickness; a step of removing the first and the second mask patterns; and a step of etching the upper part of the first and the second regions and forming a device separation pattern which defines preliminary fin-type active patterns.
申请公布号 KR20150068138(A) 申请公布日期 2015.06.19
申请号 KR20130153989 申请日期 2013.12.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, YONG JOON;KIM, MYEONG CHEOL;KIM, CHEOL;SEONG, GEUM JUNG;LEE, HAK SUN;JUNG, HAE GEON;HAN, JI EUN
分类号 H01L21/336 主分类号 H01L21/336
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