发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device according to the present embodiment includes a first insulating film above a substrate. Contact plugs are located in contact holes passing through the first insulating film, respectively. The contact plugs have upper surfaces at positions lower than an upper surface of the first insulating film, respectively. Wires are located on the upper surface of the first insulating film. The wires are located at positions lower than the upper surface of the first insulating film to connect to upper surfaces of the contact plugs at positions of the contact holes, respectively.
申请公布号 US2015171011(A1) 申请公布日期 2015.06.18
申请号 US201414197832 申请日期 2014.03.05
申请人 Kabushiki Kaisha Toshiba 发明人 Kato Atsushi
分类号 H01L23/522;H01L23/532;H01L21/768 主分类号 H01L23/522
代理机构 代理人
主权项 1. A semiconductor device comprising: a first insulating film above a substrate; contact plugs being in contact holes passing through the first insulating film and having upper surfaces at positions lower than an upper surface of the first insulating film, respectively, and wires on the upper surface of the first insulating film, the wires being at positions lower than the upper surface of the first insulating film to connect to upper surfaces of the contact plugs at positions of the contact holes, respectively.
地址 Minato-Ku JP