发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
Provided is a semiconductor device and a method for fabricating the same. The semiconductor device includes an interlayer insulating layer formed on a semiconductor substrate, a metal contact plug penetrating the interlayer insulating layer, a cylindrical lower electrode formed on the metal contact plug and including a first metal and a trench, a supporter formed in the trench and including a second metal that is different from the first metal, a dielectric layer formed on the lower electrode and the supporter and an upper electrode formed on the dielectric layer. |
申请公布号 |
US2015171159(A1) |
申请公布日期 |
2015.06.18 |
申请号 |
US201414459455 |
申请日期 |
2014.08.14 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
LIM Han-jin |
分类号 |
H01L49/02;H01L27/108 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
an interlayer insulating layer on a semiconductor substrate; a metal contact plug in at least a portion of the interlayer insulating layer; a cylindrical lower electrode on the metal contact plug and including a first metal and a trench; a supporter in the trench and including a second metal that is different from the first metal; a dielectric layer on the lower electrode and the supporter; and an upper electrode on the dielectric layer. |
地址 |
Suwon-Si KR |