发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 Provided is a semiconductor device and a method for fabricating the same. The semiconductor device includes an interlayer insulating layer formed on a semiconductor substrate, a metal contact plug penetrating the interlayer insulating layer, a cylindrical lower electrode formed on the metal contact plug and including a first metal and a trench, a supporter formed in the trench and including a second metal that is different from the first metal, a dielectric layer formed on the lower electrode and the supporter and an upper electrode formed on the dielectric layer.
申请公布号 US2015171159(A1) 申请公布日期 2015.06.18
申请号 US201414459455 申请日期 2014.08.14
申请人 Samsung Electronics Co., Ltd. 发明人 LIM Han-jin
分类号 H01L49/02;H01L27/108 主分类号 H01L49/02
代理机构 代理人
主权项 1. A semiconductor device comprising: an interlayer insulating layer on a semiconductor substrate; a metal contact plug in at least a portion of the interlayer insulating layer; a cylindrical lower electrode on the metal contact plug and including a first metal and a trench; a supporter in the trench and including a second metal that is different from the first metal; a dielectric layer on the lower electrode and the supporter; and an upper electrode on the dielectric layer.
地址 Suwon-Si KR